ISO 15632:2002
Microbeam analysis — Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
Reference number
ISO 15632:2002
Edición 1
2002-12
© ISO 2024
Retirada
Retirada (Edición 1, 2002)

Resumen

ISO 15632 defines the most important quantities that characterize an energy dispersive X-ray spectrometer (EDS) consisting of a semiconductor detector, a pre-amplifier and a signal processing unit as the essential parts. This International Standard is only applicable to spectrometers with semiconductor detectors operating on the principle of solid state ionization. It specifies minimum requirements for such spectrometers attached to an electron probe microanalyser (EPMA) or a scanning electron microscope (SEM). Realization of the analysis is outside the scope of this International Standard.

Informaciones generales

  • Estado
     : Retirada
    Fecha de publicación
     : 2002-12
    Etapa
    : Retirada de la Norma Internacional [95.99]
  • Edición
     : 1
    Número de páginas
     : 8
  • Comité Técnico :
    ISO/TC 202
    ICS :
    37.020  71.040.99 
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