International Standard
ISO 22493:2014
Microbeam analysis — Scanning electron microscopy — Vocabulary
Reference number
ISO 22493:2014
Edición 2
2014-04
© ISO 2024
International Standard
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Publicado (Edición 2, 2014)

ISO 22493:2014

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Idioma
CHF 129
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Resumen

ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

Informaciones generales

  • Estado
     : Publicado
    Fecha de publicación
     : 2014-04
    Etapa
    : Cierre de la revisión [90.60]
  • Edición
     : 2
    Número de páginas
     : 20
  • Comité Técnico :
    ISO/TC 202/SC 1
    ICS :
    37.020  01.040.37 
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