International Standard
ISO 17915:2018
Optics and photonics — Measurement method of semiconductor lasers for sensing
Reference number
ISO 17915:2018
Edición 1
2018-05
International Standard
Vista previa
ISO 17915:2018
72946
No disponible en español
Publicado (Edición 1, 2018)
Esta norma se revisó y confirmó por última vez en 2023. Por lo tanto, esta versión es la actual.

ISO 17915:2018

ISO 17915:2018
72946
Idioma
Formato
CHF 151
Convertir Franco suizo (CHF) a tu moneda

Resumen

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

Informaciones generales

  •  : Publicado
     : 2018-05
    : Norma Internacional confirmada [90.93]
  •  : 1
     : 29
  • ISO/TC 172/SC 9
    31.260 
  • RSS actualizaciones

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)