Résumé
This document specifies procedures for the measurement of dislocation density in thin metals by using transmission electron microscope. This document applies to measure the dislocation density lower than 11015m-2. This document applies to analyse the dislocations in a single grain of the thin metals’ specimen with the thickness between tens to hundreds of nanometers.
Informations générales
-
État actuel: ProjetStade: Clôture de la période des observations [20.60]
-
Edition: 1
-
Comité technique :ISO/TC 202/SC 3
- RSS mises à jour