International Standard
ISO 21222:2020
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Reference number
ISO 21222:2020
Edition 1
International Standard
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ISO 21222:2020
Published (Edition 1, 2020)

ISO 21222:2020

ISO 21222:2020
CHF 96
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This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.

General information

  •  : Published
     : 2020-01
    : International Standard published [60.60]
  •  : 1
     : 17
  • ISO/TC 201/SC 9
  • RSS updates

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