Abstract
Specifies measuring methods so that the film/process system can be obtained reproducibly and can also be compared with those of other systems. Describes sensitometric procedures for films exposed directly to X-rays. This second edition cancels and replaces the first edition (1981).
Life cycle
-
Previously
WithdrawnISO 5799:1981
-
Now
Customer care
+41 22 749 08 88
Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)