Abstract
Describes test methods for the characteristics of identification cards, also integrated circuit cards, in accordance with ISO 7810, ISO 7811, ISO 7813, and ISO 7816.
General information
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Status: WithdrawnPublication date: 1993-12Stage: Withdrawal of International Standard [95.99]
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Edition: 1Number of pages: 29
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Technical Committee :ISO/IEC JTC 1/SC 17ICS :35.240.15
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Life cycle
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