ISO 16700:2004
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
Reference number
ISO 16700:2004
Edition 1
2004-03
© ISO 2024
Withdrawn
Withdrawn (Edition 1, 2004)

Abstract

ISO 16700:2004 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.

General information

  • Status
     : Withdrawn
    Publication date
     : 2004-03
    Stage
    : Withdrawal of International Standard [95.99]
  • Edition
     : 1
    Number of pages
     : 16
  • Technical Committee :
    ISO/TC 202/SC 4
    ICS :
    37.020 
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