This standard was last reviewed and confirmed in 2022. Therefore this version remains current.
This International Standard provides procedures for electron microprobe elemental-mapping analysis using
wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally
across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is
assessed. It describes five types of data processing: the raw X‑ray intensity data method, the k‑value method,
the calibration method, the correlation method and the matrix correction method.
Status: PublishedPublication date: 2012-03
Edition: 1Number of pages: 10
Technical Committee: ISO/TC 202/SC 2 Electron probe microanalysis
- ICS :
- 71.040.50 Physicochemical methods of analysis
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|std 1 61|
|std 2 61||Paper|
A standard is reviewed every 5 years
Stage: 90.93 (Confirmed)
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