Reference number
ISO 11938:2012
ISO 11938:2012
© ISO 2024
International Standard
ISO 11938:2012
Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Edition 1
2012-03
2012-03
ISO 11938:2012
51059
Published
(Edition 1, 2012)
This publication was last reviewed and confirmed in 2022.
Therefore this version remains current.
Abstract
This International Standard provides procedures for electron microprobe elemental-mapping analysis using
wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally
across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is
assessed. It describes five types of data processing: the raw X‑ray intensity data method, the k‑value method,
the calibration method, the correlation method and the matrix correction method.
General information
-
Status: PublishedPublication date: 2012-03Stage: International Standard confirmed [90.93]
-
Edition: 1Number of pages: 10
-
Technical Committee :ISO/TC 202/SC 2ICS :71.040.50
- RSS updates
Life cycle
Customer care
+41 22 749 08 88
Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)