ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.
This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.
Status: PublishedPublication date: 2011-12
Edition: 1Number of pages: 2
Technical Committee: ISO/TC 135/SC 5 Radiographic testing
- ICS :
- 19.100 Non-destructive testing
This standard contributes to the following Sustainable Development Goals:
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Stage: 90.93 (Confirmed)
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