Abstract
ISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.
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General information
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Status: PublishedPublication date: 2015-11Stage: International Standard confirmed [90.93]
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Edition: 1Number of pages: 22
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Technical Committee :ISO/TC 201/SC 7ICS :71.040.40
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