ISO/AWI 16666
u
ISO/AWI 16666
84747

Abstract

This document specifies terms and definitions for analytical methods where elements are identified and their concentrations determined by measuring X ray fluorescence radiation. The aim of this document is to establish terms and definitions for TXRF and to match these with terms and definitions relating to X ray fluorescence analysis.


General information 

  •  : Under development
  •  : 1
  •  : ISO/TC 201/SC 10 X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis
  •  :

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