ISO/CD 4508
Surface chemical analysis--Scanning probe microscopy--Guidelines for the method and procedure for determining the effect of temperature on AFM nano-scale dimension measurements
Reference number
ISO/CD 4508
Edición 1
Committee Draft
ISO/CD 4508
80040
El comité está revisando un borrador.

Resumen

This International Standard specifies the guidelines of the method and procedure for determining the effect of temperature on atomic force microscope (AFM) nano-scale dimension measurements. The effect of temperature can be evaluated by continuously measuring the changes of the X- and Y- pitches and height of a two-dimensional (2D) calibration grating in an environmental temperature controllable AFM. If necessary, this method and procedure can be used to evaluate the effect of temperature on dimension measurement of other scanning probe microscopes(SPMs).

Informaciones generales

  •  : En desarrollo
    : Cierre del periodo de observaciones [30.60]
  •  : 1
  • ISO/TC 201/SC 9
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